Atalla, Yousif, Mohamad Hafiz Mamat, and Yasir Hashim. “Characterization and Optimization of Si-FinFET Structure Based on Gate Length and Working Temperature”. International Journal of Integrated Engineering 17, no. 2 (July 27, 2025): 177–185. Accessed August 7, 2026. https://journal.uthm.edu.my/index.php/ijie/article/view/17145.