FOO, Lim Teck; AHMAD, Ibrahim; SULONG, Muhammad Suhaimi. Device Characterization of 0.21 μm CMOS Device. Journal of Science and Technology, [S. l.], v. 1, n. 1, 2009. Disponível em: https://journal.uthm.edu.my/index.php/JST/article/view/266. Acesso em: 13 aug. 2026.